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Exceptional point enhanced small particle detection in systems of subwavelength resonators

by J. Cao and J. Nick

(Report number 2025-12)

Abstract
This paper considers the effects of small highly contrasted particles on the subwavelength resonances of a system of high-contrast resonators, with an application to sensing. The key technique is a multiple scattering expansion of the capacitance matrix associated with the perturbed system. At leading order, the perturbation of the scattering resonances is characterized by the associated term of the truncated multiple scattering expansion. When an exceptional point is present in the resonance structure, the perturbation critically affects the subwavelength resonances, which improves the sensitivity of a sensing task in the presence of noise. Numerical experiments demonstrate the use of the proposed reconstruction techniques.

Keywords: Capacitance matrix, Exceptional points, Particle detection, Multiple scattering

@Techreport{CN25_1133,
  author = {J. Cao and J. Nick},
  title = {Exceptional point enhanced small particle detection in systems of subwavelength resonators},
  institution = {Seminar for Applied Mathematics, ETH Z{\"u}rich},
  number = {2025-12},
  address = {Switzerland},
  url = {https://www.sam.math.ethz.ch/sam_reports/reports_final/reports2025/2025-12.pdf },
  year = {2025}
}

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