Research reports

Robustness of Valley-Hall Interface Modes Against Sharp Bending

by H. Ammari and J. Qiu

(Report number 2026-20)

Abstract
It is well known that band inversion across a straight interface in a periodic medium gives rise to interface modes that are localized near the interface and propagate along it inside the bulk spectral gap. This phenomenon constitutes the key mechanism underlying the valley-Hall effect. In this paper, we address the long-standing problem of the robustness of such interface modes. We prove that, when the interface is bent through an angle of \(2\pi/3\), the interface modes persist for every frequency in the bulk spectral gap where the group velocity is non-vanishing, except for a finite exceptional set. We also show that corner-localized modes, if they occur, can appear only at these exceptional frequencies and have finite multiplicity. To the best of our knowledge, this is the first rigorous mathematical theory of the bending immunity of valley-Hall interface modes.

Keywords: bent interface, sharp-bend robustness, interface mode, corner-localized mode, valley-Hall effect, Dirac degeneracy, inversion-symmetry breaking, layer-potential theory on unbounded interfaces

BibTeX
@Techreport{AQ26_1175,
  author = {H. Ammari and J. Qiu},
  title = {Robustness of Valley-Hall Interface Modes Against Sharp Bending},
  institution = {Seminar for Applied Mathematics, ETH Z{\"u}rich},
  number = {2026-20},
  address = {Switzerland},
  url = {https://www.sam.math.ethz.ch/sam_reports/reports_final/reports2026/2026-20.pdf },
  year = {2026}
}

Disclaimer
© Copyright for documents on this server remains with the authors. Copies of these documents made by electronic or mechanical means including information storage and retrieval systems, may only be employed for personal use. The administrators respectfully request that authors inform them when any paper is published to avoid copyright infringement. Note that unauthorised copying of copyright material is illegal and may lead to prosecution. Neither the administrators nor the Seminar for Applied Mathematics (SAM) accept any liability in this respect. The most recent version of a SAM report may differ in formatting and style from published journal version. Do reference the published version if possible (see SAM Publications).

JavaScript has been disabled in your browser