Research reports
Childpage navigation
Years: 2025 2024 2023 2022 2021 2020 2019 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 2008 2007 2006 2005 2004 2003 2002 2001 2000 1999 1998 1997 1996 1995 1994 1993 1992 1991
A Two-Scale Effective Model for Defect-Induced Localization Transitions in Non-Hermitian Systems
by B. Davies and S. Barandun and E.O. Hiltunen and R.V. Craster and H. Ammari
(Report number 2024-12)
Abstract
We illuminate the fundamental mechanism responsible for the transition between the non-Hermitian skin effect and defect-induced localization in the bulk. We study a Hamiltonian with non-reciprocal couplings that exhibits the skin effect (the localization of all eigenvectors at one edge) and add an on-site defect in the center. Using a two-scale asymptotic method, we characterize the long-scale growth and decay of the eigenvectors and derive a simple and intuitive effective model for the transition that occurs when the defect is sufficiently large that one of the modes is localized at the defect site, rather than at the edge of the system.
Keywords: Localization transition, non-Hermitian system, two-scale effective model
BibTeX@Techreport{DBHCA24_1094, author = {B. Davies and S. Barandun and E.O. Hiltunen and R.V. Craster and H. Ammari}, title = {A Two-Scale Effective Model for Defect-Induced Localization Transitions in Non-Hermitian Systems}, institution = {Seminar for Applied Mathematics, ETH Z{\"u}rich}, number = {2024-12}, address = {Switzerland}, url = {https://www.sam.math.ethz.ch/sam_reports/reports_final/reports2024/2024-12.pdf }, year = {2024} }
Disclaimer
© Copyright for documents on this server remains with the authors.
Copies of these documents made by electronic or mechanical means including
information storage and retrieval systems, may only be employed for
personal use. The administrators respectfully request that authors
inform them when any paper is published to avoid copyright infringement.
Note that unauthorised copying of copyright material is illegal and may
lead to prosecution. Neither the administrators nor the Seminar for
Applied Mathematics (SAM) accept any liability in this respect.
The most recent version of a SAM report may differ in formatting and style
from published journal version. Do reference the published version if
possible (see SAM
Publications).